The non-contact resistance measurement systems for laboratory and development applications.
The sensor is mounted under the supporting surface. Therefore,
samples of different sizes with a thickness up to 1 mm can be
easily and reliably measured. The measurement systems of the Series
M-RES 20-xxx are very well suitable for the measurement of
coated films or plates, as well as for measurements on wafers
or cutted samples.
Out of a number of different models with different measurement
ranges the best system can be found.